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Book Description Soft Cover. Condition: new. This item is printed on demand. Seller Inventory # 9781461366676
Book Description Condition: New. Seller Inventory # 21687695-n
Book Description Condition: New. Seller Inventory # ABLIING23Mar2716030033223
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9781461366676_lsuk
Book Description Condition: New. Seller Inventory # 21687695-n
Book Description Paperback. Condition: Brand New. reprint edition. 764 pages. 10.00x7.01x1.53 inches. In Stock. Seller Inventory # x-1461366674
Book Description Condition: New. Editor(s): Barrett, C. S.; Amara, M.; Huang, Ting C.; Bernard, Nick; Knorr, Dietrich. Num Pages: 743 pages, 224 black & white illustrations, 2 colour illustrations, biography. BIC Classification: PNF; TGMT; THR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 39. Weight in Grams: 1436. . 2013. Softcover reprint of the original 1st ed. 1991. Paperback. . . . . Seller Inventory # V9781461366676
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The 'Denver Conference' is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: 'Surface and Near-Surface X-Ray Spectroscopy. ' The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed 'Recent Developments and Results in Total-Reflection X-Ray Fluorescence. ' Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on 'Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. ' He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described. Seller Inventory # 9781461366676
Book Description PF. Condition: New. Seller Inventory # 6666-IUK-9781461366676
Book Description Condition: New. Editor(s): Barrett, C. S.; Amara, M.; Huang, Ting C.; Bernard, Nick; Knorr, Dietrich. Num Pages: 743 pages, 224 black & white illustrations, 2 colour illustrations, biography. BIC Classification: PNF; TGMT; THR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 39. Weight in Grams: 1436. . 2013. Softcover reprint of the original 1st ed. 1991. Paperback. . . . . Books ship from the US and Ireland. Seller Inventory # V9781461366676